APA (7th ed.) Citation

Schmid, D., Eisermann, R., Peczek, A., Winzer, G., Zimmermann, L., & Krenek, S. Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation. MDPI AG.

Chicago Style (17th ed.) Citation

Schmid, Daniel, René Eisermann, Anna Peczek, Georg Winzer, Lars Zimmermann, and Stephan Krenek. Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation. MDPI AG.

MLA (9th ed.) Citation

Schmid, Daniel, et al. Wafer-Scale Experimental Determination of Coupling and Loss for Photonic Integrated Circuit Design Optimisation. MDPI AG.