Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test
At present, accelerated degradation test research is carried out mostly for single stress condition, while the products are faced with an operating condition of many environmental stresses in the field. This paper presented a data modeling method and analysis process for accelerated degradation test...
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| Format: | Article |
| Language: | zho |
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Editorial Office of Control and Information Technology
2018-01-01
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| Series: | Kongzhi Yu Xinxi Jishu |
| Subjects: | |
| Online Access: | http://ctet.csrzic.com/thesisDetails#10.13889/j.issn.2096-5427.2018.05.015 |
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| _version_ | 1849224894066196480 |
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| author | YIN Chao ZHOU Guifa WANG Xu DU Shaohua |
| author_facet | YIN Chao ZHOU Guifa WANG Xu DU Shaohua |
| author_sort | YIN Chao |
| collection | DOAJ |
| description | At present, accelerated degradation test research is carried out mostly for single stress condition, while the products are faced with an operating condition of many environmental stresses in the field. This paper presented a data modeling method and analysis process for accelerated degradation test under multi-stress, and designed an accelerated degradation test scheme for temperature and humidity comprehensive stress for a control circuit board. Based on the first application of stability test in time series analysis and accelerated degradation test under multi-stress condition, it can be concluded that the parameters of the control board are not degraded under both test and field conditions. |
| format | Article |
| id | doaj-art-9c11edf169994e28ae672feb7f7af397 |
| institution | Kabale University |
| issn | 2096-5427 |
| language | zho |
| publishDate | 2018-01-01 |
| publisher | Editorial Office of Control and Information Technology |
| record_format | Article |
| series | Kongzhi Yu Xinxi Jishu |
| spelling | doaj-art-9c11edf169994e28ae672feb7f7af3972025-08-25T06:51:49ZzhoEditorial Office of Control and Information TechnologyKongzhi Yu Xinxi Jishu2096-54272018-01-0135707382325128Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation TestYIN ChaoZHOU GuifaWANG XuDU ShaohuaAt present, accelerated degradation test research is carried out mostly for single stress condition, while the products are faced with an operating condition of many environmental stresses in the field. This paper presented a data modeling method and analysis process for accelerated degradation test under multi-stress, and designed an accelerated degradation test scheme for temperature and humidity comprehensive stress for a control circuit board. Based on the first application of stability test in time series analysis and accelerated degradation test under multi-stress condition, it can be concluded that the parameters of the control board are not degraded under both test and field conditions.http://ctet.csrzic.com/thesisDetails#10.13889/j.issn.2096-5427.2018.05.015accelerated degradation testmulti-stress conditiondegradation modelstability testcircuit board |
| spellingShingle | YIN Chao ZHOU Guifa WANG Xu DU Shaohua Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test Kongzhi Yu Xinxi Jishu accelerated degradation test multi-stress condition degradation model stability test circuit board |
| title | Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test |
| title_full | Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test |
| title_fullStr | Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test |
| title_full_unstemmed | Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test |
| title_short | Degradation and Reliability Analysis of a Circuit Board Based on Accelerated Degradation Test |
| title_sort | degradation and reliability analysis of a circuit board based on accelerated degradation test |
| topic | accelerated degradation test multi-stress condition degradation model stability test circuit board |
| url | http://ctet.csrzic.com/thesisDetails#10.13889/j.issn.2096-5427.2018.05.015 |
| work_keys_str_mv | AT yinchao degradationandreliabilityanalysisofacircuitboardbasedonaccelerateddegradationtest AT zhouguifa degradationandreliabilityanalysisofacircuitboardbasedonaccelerateddegradationtest AT wangxu degradationandreliabilityanalysisofacircuitboardbasedonaccelerateddegradationtest AT dushaohua degradationandreliabilityanalysisofacircuitboardbasedonaccelerateddegradationtest |