APA (7th ed.) Citation

Motamedi, M., Shidpour, R., & Ezoji, M. LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns. Nature Portfolio.

Chicago Style (17th ed.) Citation

Motamedi, Mehran, Reza Shidpour, and Mehdi Ezoji. LSTM-based Framework for Predicting Point Defect Percentage in Semiconductor Materials Using Simulated XRD Patterns. Nature Portfolio.

MLA (9th ed.) Citation

Motamedi, Mehran, et al. LSTM-based Framework for Predicting Point Defect Percentage in Semiconductor Materials Using Simulated XRD Patterns. Nature Portfolio.