Deep Level Saturation Spectroscopy

We review the “Deep Level Saturation Spectroscopy” (DLSS) as the nonlinear method to study the deep local defects in semiconductors. The essence of a method is determined by the processes of sufficiently strong laser modulation (up to saturation) of quasistationar two-step absorption of the probe li...

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Bibliographic Details
Main Author: Vladimir Gavryushin
Format: Article
Language:English
Published: Wiley 2012-01-01
Series:International Journal of Optics
Online Access:http://dx.doi.org/10.1155/2012/505023
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