A New Method of Remaining Useful Lifetime Estimation for a Degradation Process with Random Jumps

With the deepening of degradation, the stability and reliability of the degrading system usually becomes poor, which may lead to random jumps occurring in the degradation path. A non-homogeneous jump diffusion process model is introduced to more accurately capture this type of degradation. In this p...

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Bibliographic Details
Main Authors: Yue Zhuo, Lei Feng, Jianxun Zhang, Xiaosheng Si, Zhengxin Zhang
Format: Article
Language:English
Published: MDPI AG 2025-07-01
Series:Sensors
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Online Access:https://www.mdpi.com/1424-8220/25/15/4534
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