Jeong, I., Kang, M., Kim, J., Kim, J., Ha, J., & Choi, B. Enhanced DET-Based Fault Signature Analysis for Reliable Diagnosis of Single and Multiple-Combined Bearing Defects. Wiley.
Chicago Style (17th ed.) CitationJeong, In-Kyu, Myeongsu Kang, Jaeyoung Kim, Jong-Myon Kim, Jeong-Min Ha, and Byeong-Keun Choi. Enhanced DET-Based Fault Signature Analysis for Reliable Diagnosis of Single and Multiple-Combined Bearing Defects. Wiley.
MLA (9th ed.) CitationJeong, In-Kyu, et al. Enhanced DET-Based Fault Signature Analysis for Reliable Diagnosis of Single and Multiple-Combined Bearing Defects. Wiley.
Warning: These citations may not always be 100% accurate.