Influence of Series Massive Resistance on Capacitance and Conductance Characteristics in Gate-Recessed Nanoscale SOI MOSFETs
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Main Authors: | Avraham Karsenty, Avraham Chelly |
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Format: | Article |
Language: | English |
Published: |
Wiley
2013-01-01
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Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/2013/813518 |
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