Simpler Reference-Plane-Invariant Method for Permittivity Extraction of Medium- or Low-Loss Dielectric Samples Using One-Port Measurements
A microwave method is devised to extract relative complex permittivity (<inline-formula> <tex-math notation="LaTeX">$\varepsilon _{r}$ </tex-math></inline-formula>) of medium- or low-loss dielectric samples. It is simpler, non-iterative, reference-plane-invariant (R...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10716378/ |
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