APA (7th ed.) Citation

Nguyen, V., Kieu, X., Chu, D., HoangVan, X., Tan, P. X., & Le, T. N. Deep learning-enhanced defects detection for printed circuit boards. Elsevier.

Chicago Style (17th ed.) Citation

Nguyen, Van-Truong, Xuan-Thuc Kieu, Duc-Tuan Chu, Xiem HoangVan, Phan Xuan Tan, and Tuyen Ngoc Le. Deep Learning-enhanced Defects Detection for Printed Circuit Boards. Elsevier.

MLA (9th ed.) Citation

Nguyen, Van-Truong, et al. Deep Learning-enhanced Defects Detection for Printed Circuit Boards. Elsevier.