Double Adjacent Error Correction Codes for Ultra-Fast Cache Memories
Error correction codes are commonly used to protect cache memories from soft errors. As technology feature size scales deeper into sub-nanometer regime, radiation-induced soft error can causes double adjacent error (DAE). Several double adjacent error correction (DAEC) codes have been introduced to...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10813377/ |
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