The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors

The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors

1 μm-thick YBa2Cu3O7-δ (YBCO) films were grown on the Y2O3/yttria stabilized zirconia (YSZ)/CeO2 buffer layers with different surface morphologies using direct-current sputtering. The critical current density (Jc) value of YBCO was 1.1 MA/cm2 when the root mean square surface roughness (Rrms) of the...

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Bibliographic Details
Main Authors: Jie Xiong, Yudong Xia, Fei Zhang, Yan Xue, Kai Hu, Xiaohui Zhao, Bowan Tao
Format: Article
Language:English
Published: Wiley 2013-01-01
Series:Advances in Condensed Matter Physics
Online Access:http://dx.doi.org/10.1155/2013/673948
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