The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors
1 μm-thick YBa2Cu3O7-δ (YBCO) films were grown on the Y2O3/yttria stabilized zirconia (YSZ)/CeO2 buffer layers with different surface morphologies using direct-current sputtering. The critical current density (Jc) value of YBCO was 1.1 MA/cm2 when the root mean square surface roughness (Rrms) of the...
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| Format: | Article |
| Language: | English |
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Wiley
2013-01-01
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| Series: | Advances in Condensed Matter Physics |
| Online Access: | http://dx.doi.org/10.1155/2013/673948 |
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| author | Jie Xiong Yudong Xia Fei Zhang Yan Xue Kai Hu Xiaohui Zhao Bowan Tao |
| author_facet | Jie Xiong Yudong Xia Fei Zhang Yan Xue Kai Hu Xiaohui Zhao Bowan Tao |
| author_sort | Jie Xiong |
| collection | DOAJ |
| description | 1 μm-thick YBa2Cu3O7-δ (YBCO) films were grown on the Y2O3/yttria stabilized zirconia (YSZ)/CeO2 buffer layers with different surface morphologies using direct-current sputtering. The critical current density (Jc) value of YBCO was 1.1 MA/cm2 when the root mean square surface roughness (Rrms) of the buffer layer was 2.5 nm. As the Rrms of the buffer layer increased to 15 nm, the Jc decreased to 0.3 MA/cm2. X-ray diffraction and scanning electron microscopy showed the strong relevance of the evolution of the structure and surface morphologies of YBCO films with the buffer layer of different Rrms. A model was proposed to explain the influence of surface morphology on the superconducting properties of YBCO films. |
| format | Article |
| id | doaj-art-8e661ac44ba5412592ac59be81b2e631 |
| institution | Kabale University |
| issn | 1687-8108 1687-8124 |
| language | English |
| publishDate | 2013-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Advances in Condensed Matter Physics |
| spelling | doaj-art-8e661ac44ba5412592ac59be81b2e6312025-02-03T05:50:57ZengWileyAdvances in Condensed Matter Physics1687-81081687-81242013-01-01201310.1155/2013/673948673948The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated ConductorsJie Xiong0Yudong Xia1Fei Zhang2Yan Xue3Kai Hu4Xiaohui Zhao5Bowan Tao6State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, ChinaState Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, ChinaState Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, ChinaState Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, ChinaState Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, ChinaState Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, ChinaState Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China1 μm-thick YBa2Cu3O7-δ (YBCO) films were grown on the Y2O3/yttria stabilized zirconia (YSZ)/CeO2 buffer layers with different surface morphologies using direct-current sputtering. The critical current density (Jc) value of YBCO was 1.1 MA/cm2 when the root mean square surface roughness (Rrms) of the buffer layer was 2.5 nm. As the Rrms of the buffer layer increased to 15 nm, the Jc decreased to 0.3 MA/cm2. X-ray diffraction and scanning electron microscopy showed the strong relevance of the evolution of the structure and surface morphologies of YBCO films with the buffer layer of different Rrms. A model was proposed to explain the influence of surface morphology on the superconducting properties of YBCO films.http://dx.doi.org/10.1155/2013/673948 |
| spellingShingle | Jie Xiong Yudong Xia Fei Zhang Yan Xue Kai Hu Xiaohui Zhao Bowan Tao The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors Advances in Condensed Matter Physics |
| title | The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors |
| title_full | The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors |
| title_fullStr | The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors |
| title_full_unstemmed | The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors |
| title_short | The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors |
| title_sort | influence of surface morphology of buffer layer on the critical current density in ybco coated conductors |
| url | http://dx.doi.org/10.1155/2013/673948 |
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