Enhancing Interpretability of Neural Compact Models: Toward Reliable Device Modeling
Neural Compact Models (NCMs) have emerged as a crucial tool to meet the stringent demands of Design-Technology Co-Optimization (DTCO) and to overcome the complexities and prolonged development cycles encountered in traditional compact model creation. Despite their efficiency in simulating electronic...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10547540/ |
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