APA (7th ed.) Citation

Park, C., Cho, H., & Lee, J. Enhancing Interpretability of Neural Compact Models: Toward Reliable Device Modeling. IEEE.

Chicago Style (17th ed.) Citation

Park, Chanwoo, Hyunbo Cho, and Jungwoo Lee. Enhancing Interpretability of Neural Compact Models: Toward Reliable Device Modeling. IEEE.

MLA (9th ed.) Citation

Park, Chanwoo, et al. Enhancing Interpretability of Neural Compact Models: Toward Reliable Device Modeling. IEEE.