Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample

Abstract We propose a multi-frame blind deconvolution method using an in-plane rotating sample optimized for X-ray microscopy, where the application of existing deconvolution methods is technically difficult. Untrained neural networks are employed as the reconstruction algorithm to enable robust rec...

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Main Authors: Shinnosuke Kurimoto, Takato Inoue, Hitoshi Aoto, Toshiki Ito, Satsuki Ito, Yoshiki Kohmura, Makina Yabashi, Satoshi Matsuyama
Format: Article
Language:English
Published: Nature Portfolio 2024-11-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-024-79237-x
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author Shinnosuke Kurimoto
Takato Inoue
Hitoshi Aoto
Toshiki Ito
Satsuki Ito
Yoshiki Kohmura
Makina Yabashi
Satoshi Matsuyama
author_facet Shinnosuke Kurimoto
Takato Inoue
Hitoshi Aoto
Toshiki Ito
Satsuki Ito
Yoshiki Kohmura
Makina Yabashi
Satoshi Matsuyama
author_sort Shinnosuke Kurimoto
collection DOAJ
description Abstract We propose a multi-frame blind deconvolution method using an in-plane rotating sample optimized for X-ray microscopy, where the application of existing deconvolution methods is technically difficult. Untrained neural networks are employed as the reconstruction algorithm to enable robust reconstruction against stage motion errors caused by the in-plane rotation of samples. From demonstration experiments using full-field X-ray microscopy with advanced Kirkpatrick–Baez mirror optics at SPring-8, a spatial resolution of 34 nm (half period) was successfully achieved by removing the wavefront aberration and improving the apparent numerical aperture. This method can contribute to the cost-effective improvement of X-ray microscopes with imperfect lenses as well as the reconstruction of the phase information of samples and lenses.
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institution Kabale University
issn 2045-2322
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publishDate 2024-11-01
publisher Nature Portfolio
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spelling doaj-art-88d0f16cbd034d8babd68139ea08b5af2025-02-02T12:25:36ZengNature PortfolioScientific Reports2045-23222024-11-0114111310.1038/s41598-024-79237-xMulti-frame blind deconvolution using X-ray microscope images of an in-plane rotating sampleShinnosuke Kurimoto0Takato Inoue1Hitoshi Aoto2Toshiki Ito3Satsuki Ito4Yoshiki Kohmura5Makina Yabashi6Satoshi Matsuyama7Department of Materials Physics, Graduate School of Engineering, Nagoya UniversityDepartment of Materials Physics, Graduate School of Engineering, Nagoya UniversityDepartment of Materials Physics, Graduate School of Engineering, Nagoya UniversityDepartment of Materials Physics, Graduate School of Engineering, Nagoya UniversityDepartment of Materials Physics, Graduate School of Engineering, Nagoya UniversityRIKEN SPring-8 CenterRIKEN SPring-8 CenterDepartment of Materials Physics, Graduate School of Engineering, Nagoya UniversityAbstract We propose a multi-frame blind deconvolution method using an in-plane rotating sample optimized for X-ray microscopy, where the application of existing deconvolution methods is technically difficult. Untrained neural networks are employed as the reconstruction algorithm to enable robust reconstruction against stage motion errors caused by the in-plane rotation of samples. From demonstration experiments using full-field X-ray microscopy with advanced Kirkpatrick–Baez mirror optics at SPring-8, a spatial resolution of 34 nm (half period) was successfully achieved by removing the wavefront aberration and improving the apparent numerical aperture. This method can contribute to the cost-effective improvement of X-ray microscopes with imperfect lenses as well as the reconstruction of the phase information of samples and lenses.https://doi.org/10.1038/s41598-024-79237-x
spellingShingle Shinnosuke Kurimoto
Takato Inoue
Hitoshi Aoto
Toshiki Ito
Satsuki Ito
Yoshiki Kohmura
Makina Yabashi
Satoshi Matsuyama
Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample
Scientific Reports
title Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample
title_full Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample
title_fullStr Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample
title_full_unstemmed Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample
title_short Multi-frame blind deconvolution using X-ray microscope images of an in-plane rotating sample
title_sort multi frame blind deconvolution using x ray microscope images of an in plane rotating sample
url https://doi.org/10.1038/s41598-024-79237-x
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