Lu, K., & Meshii, T. Application of T33-Stress to Predict the Lower Bound Fracture Toughness for Increasing the Test Specimen Thickness in the Transition Temperature Region. Wiley.
Chicago Style (17th ed.) CitationLu, Kai, and Toshiyuki Meshii. Application of T33-Stress to Predict the Lower Bound Fracture Toughness for Increasing the Test Specimen Thickness in the Transition Temperature Region. Wiley.
MLA (9th ed.) CitationLu, Kai, and Toshiyuki Meshii. Application of T33-Stress to Predict the Lower Bound Fracture Toughness for Increasing the Test Specimen Thickness in the Transition Temperature Region. Wiley.
Warning: These citations may not always be 100% accurate.