Evolution of the Microstructure and Performance of Pd/Ag - Based Thick Conductors
Pd/Ag-based inks are probably the most commonly used conductors in thick-film hybrid technology. The evolution of the microstructure of these films was studied on samples fired with isochronal cycles at a peak temperature in the range from 300℃ up to 850℃. The samples were investigated by means of X...
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| Format: | Article |
| Language: | English |
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Wiley
1985-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1985/21431 |
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| _version_ | 1832550637483589632 |
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| author | Maria Prudenziati Bruno Morten Maria Franca Brigatti |
| author_facet | Maria Prudenziati Bruno Morten Maria Franca Brigatti |
| author_sort | Maria Prudenziati |
| collection | DOAJ |
| description | Pd/Ag-based inks are probably the most commonly used conductors in thick-film hybrid technology. The
evolution of the microstructure of these films was studied on samples fired with isochronal cycles at a
peak temperature in the range from 300℃ up to 850℃. The samples were investigated by means of X-ray
diffraction, SEM and EDAX analysis techniques; the results of these analyses as well as those of
thermogravimetry (TG, DTG) and differential thermal analysis (DTA), enable one to obtain a clear
picture of the complex evolution of the microstructure of these conductors, which correlates quite strictly
with the performance of the films in terms of resistivity and adhesion. |
| format | Article |
| id | doaj-art-87d19b8190564b53b84d289712b83529 |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1985-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-87d19b8190564b53b84d289712b835292025-02-03T06:06:11ZengWileyActive and Passive Electronic Components0882-75161563-50311985-01-01121415710.1155/1985/21431Evolution of the Microstructure and Performance of Pd/Ag - Based Thick ConductorsMaria Prudenziati0Bruno Morten1Maria Franca Brigatti2Dipartimento di Fisica dell'Università di Modena, ItalyDipartimento di Fisica dell'Università di Modena, ItalyIstituto di Mineralogia e Petrologia dell'Università di Modena, ItalyPd/Ag-based inks are probably the most commonly used conductors in thick-film hybrid technology. The evolution of the microstructure of these films was studied on samples fired with isochronal cycles at a peak temperature in the range from 300℃ up to 850℃. The samples were investigated by means of X-ray diffraction, SEM and EDAX analysis techniques; the results of these analyses as well as those of thermogravimetry (TG, DTG) and differential thermal analysis (DTA), enable one to obtain a clear picture of the complex evolution of the microstructure of these conductors, which correlates quite strictly with the performance of the films in terms of resistivity and adhesion.http://dx.doi.org/10.1155/1985/21431 |
| spellingShingle | Maria Prudenziati Bruno Morten Maria Franca Brigatti Evolution of the Microstructure and Performance of Pd/Ag - Based Thick Conductors Active and Passive Electronic Components |
| title | Evolution of the Microstructure and Performance of Pd/Ag - Based
Thick Conductors |
| title_full | Evolution of the Microstructure and Performance of Pd/Ag - Based
Thick Conductors |
| title_fullStr | Evolution of the Microstructure and Performance of Pd/Ag - Based
Thick Conductors |
| title_full_unstemmed | Evolution of the Microstructure and Performance of Pd/Ag - Based
Thick Conductors |
| title_short | Evolution of the Microstructure and Performance of Pd/Ag - Based
Thick Conductors |
| title_sort | evolution of the microstructure and performance of pd ag based thick conductors |
| url | http://dx.doi.org/10.1155/1985/21431 |
| work_keys_str_mv | AT mariaprudenziati evolutionofthemicrostructureandperformanceofpdagbasedthickconductors AT brunomorten evolutionofthemicrostructureandperformanceofpdagbasedthickconductors AT mariafrancabrigatti evolutionofthemicrostructureandperformanceofpdagbasedthickconductors |