Critical analysis of multiple reentrant localization in an antiferromagnetic helix with transverse electric field: Hopping dimerization-free scenario

Reentrant localization (RL), a recently prominent phenomenon, traditionally links to the interplay of staggered correlated disorder and hopping dimerization, as indicated by prior research. Contrary to this paradigm, our present study demonstrates that hopping dimerization is not a pivotal factor in...

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Bibliographic Details
Main Author: Sudin Ganguly, Sourav Chattopadhyay, Kallol Mondal, Santanu K. Maiti
Format: Article
Language:English
Published: SciPost 2025-01-01
Series:SciPost Physics Core
Online Access:https://scipost.org/SciPostPhysCore.8.1.012
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Summary:Reentrant localization (RL), a recently prominent phenomenon, traditionally links to the interplay of staggered correlated disorder and hopping dimerization, as indicated by prior research. Contrary to this paradigm, our present study demonstrates that hopping dimerization is not a pivotal factor in realizing RL. Considering a helical magnetic system with antiferromagnetic ordering, we uncover spin-dependent RL at multiple energy regions, in the absence of hopping dimerization. This phenomenon persists even in the thermodynamic limit. The correlated disorder in the form of Aubry-André-Harper model is introduced by applying a transverse electric field to the helical system, circumventing the use of traditional substitutional disorder. We conduct a finite-size scaling analysis on the observed reentrant phases to identify critical points, determine associated critical exponents, and examine the scaling behavior linked to localization transitions. Additionally, we explore the parameter space to identify the conditions under which the reentrant phases occur. Described within a tight-binding framework, present work provides a novel outlook on RL, highlighting the crucial role of electric field, antiferromagnetic ordering, and the helicity of the geometry. Potential applications and experimental realizations of RL phenomena are also explored.
ISSN:2666-9366