Lee, J., & Jeong, J. Correlation Between Quantum Confinement Effect and Characteristics of Thin-Film Transistors in Solution-Processed Oxide-Based Thin-Films. IEEE.
Chicago Style (17th ed.) CitationLee, Jinyeong, and Jaewook Jeong. Correlation Between Quantum Confinement Effect and Characteristics of Thin-Film Transistors in Solution-Processed Oxide-Based Thin-Films. IEEE.
MLA (9th ed.) CitationLee, Jinyeong, and Jaewook Jeong. Correlation Between Quantum Confinement Effect and Characteristics of Thin-Film Transistors in Solution-Processed Oxide-Based Thin-Films. IEEE.
Warning: These citations may not always be 100% accurate.