Ashiwal, V., Miguel-Escrig, O., Wiesmayr, B., Zoitl, A., & Romero-Perez, J. Identification and Evaluation of Pitfalls in the Migration From IEC 61131-3 to IEC 61499: A Review. IEEE.
Chicago Style (17th ed.) CitationAshiwal, Virendra, Oscar Miguel-Escrig, Bianca Wiesmayr, Alois Zoitl, and Julio-Ariel Romero-Perez. Identification and Evaluation of Pitfalls in the Migration From IEC 61131-3 to IEC 61499: A Review. IEEE.
MLA (9th ed.) CitationAshiwal, Virendra, et al. Identification and Evaluation of Pitfalls in the Migration From IEC 61131-3 to IEC 61499: A Review. IEEE.
Warning: These citations may not always be 100% accurate.