Kim, S., Yoon, G., Baik, S., & Kang, M. Retention Characteristics and DMP Efficiency in V-NAND With Dimple Structure. IEEE.
Chicago Style (17th ed.) CitationKim, Seongwoo, Gunwook Yoon, Seungjae Baik, and Myounggon Kang. Retention Characteristics and DMP Efficiency in V-NAND With Dimple Structure. IEEE.
MLA (9th ed.) CitationKim, Seongwoo, et al. Retention Characteristics and DMP Efficiency in V-NAND With Dimple Structure. IEEE.
Warning: These citations may not always be 100% accurate.