APA (7th ed.) Citation

Wang, X., Lu, L., Tian, Q., & Lin, H. IC-GraF: An Improved Clustering with Graph-Embedding-Based Features for Software Defect Prediction. Wiley.

Chicago Style (17th ed.) Citation

Wang, Xuanye, Lu Lu, Qingyan Tian, and Haishan Lin. IC-GraF: An Improved Clustering with Graph-Embedding-Based Features for Software Defect Prediction. Wiley.

MLA (9th ed.) Citation

Wang, Xuanye, et al. IC-GraF: An Improved Clustering with Graph-Embedding-Based Features for Software Defect Prediction. Wiley.