Joe, S. Y., So, J. H., Oh, S. E., Jun, S., & Lee, S. H. Development of Cracked Egg Detection Device Using Electric Discharge Phenomenon. MDPI AG.
Chicago Style (17th ed.) CitationJoe, Sung Yong, Jun Hwi So, Seung Eel Oh, Soojin Jun, and Seung Hyun Lee. Development of Cracked Egg Detection Device Using Electric Discharge Phenomenon. MDPI AG.
MLA (9th ed.) CitationJoe, Sung Yong, et al. Development of Cracked Egg Detection Device Using Electric Discharge Phenomenon. MDPI AG.
Warning: These citations may not always be 100% accurate.