Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates

Zinc oxide thin films of different thicknesses ranging from 100 to 300 nm were prepared on polyethylene terephthalate substrates with thermal evaporation in a vacuum of approximately 3×10-5 Torr. X-ray diffraction patterns confirm the proper phase formation of the material. From atomic force microsc...

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Main Authors: M. G. Faraj, K. Ibrahim
Format: Article
Language:English
Published: Wiley 2011-01-01
Series:International Journal of Polymer Science
Online Access:http://dx.doi.org/10.1155/2011/302843
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author M. G. Faraj
K. Ibrahim
author_facet M. G. Faraj
K. Ibrahim
author_sort M. G. Faraj
collection DOAJ
description Zinc oxide thin films of different thicknesses ranging from 100 to 300 nm were prepared on polyethylene terephthalate substrates with thermal evaporation in a vacuum of approximately 3×10-5 Torr. X-ray diffraction patterns confirm the proper phase formation of the material. From atomic force microscopy (AFM) images, it was found that the root mean square roughness of the film surface increased as the film thickness increased. The optical properties of ZnO on PET substrates were determined through the optical transmission method using an ultraviolet-visible spectrophotometer. The optical band gap values of ZnO thin films slightly decreased as the film thickness increased.
format Article
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institution Kabale University
issn 1687-9422
1687-9430
language English
publishDate 2011-01-01
publisher Wiley
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series International Journal of Polymer Science
spelling doaj-art-7cc118dfef7942d58224b368719530c42025-02-03T01:20:52ZengWileyInternational Journal of Polymer Science1687-94221687-94302011-01-01201110.1155/2011/302843302843Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate SubstratesM. G. Faraj0K. Ibrahim1Nano-Optoelectronics Research and Technology Laboratory (N.O.R), School of Physics, Universiti Sains Malaysia, 11800 Penang, MalaysiaNano-Optoelectronics Research and Technology Laboratory (N.O.R), School of Physics, Universiti Sains Malaysia, 11800 Penang, MalaysiaZinc oxide thin films of different thicknesses ranging from 100 to 300 nm were prepared on polyethylene terephthalate substrates with thermal evaporation in a vacuum of approximately 3×10-5 Torr. X-ray diffraction patterns confirm the proper phase formation of the material. From atomic force microscopy (AFM) images, it was found that the root mean square roughness of the film surface increased as the film thickness increased. The optical properties of ZnO on PET substrates were determined through the optical transmission method using an ultraviolet-visible spectrophotometer. The optical band gap values of ZnO thin films slightly decreased as the film thickness increased.http://dx.doi.org/10.1155/2011/302843
spellingShingle M. G. Faraj
K. Ibrahim
Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates
International Journal of Polymer Science
title Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates
title_full Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates
title_fullStr Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates
title_full_unstemmed Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates
title_short Optical and Structural Properties of Thermally Evaporated Zinc Oxide Thin Films on Polyethylene Terephthalate Substrates
title_sort optical and structural properties of thermally evaporated zinc oxide thin films on polyethylene terephthalate substrates
url http://dx.doi.org/10.1155/2011/302843
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AT kibrahim opticalandstructuralpropertiesofthermallyevaporatedzincoxidethinfilmsonpolyethyleneterephthalatesubstrates