Probing excitons with time-resolved momentum microscopy
Excitons – two-particle correlated electron-hole pairs – are the dominant low-energy optical excitation in the broad class of semiconductor materials, which range from classical silicon to perovskites, and from two-dimensional to organic materials. The study of excitons has been brought on a new lev...
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Taylor & Francis Group
2024-12-01
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| Series: | Advances in Physics: X |
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| Online Access: | https://www.tandfonline.com/doi/10.1080/23746149.2024.2378722 |
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| author | Marcel Reutzel G. S. Matthijs Jansen Stefan Mathias |
| author_facet | Marcel Reutzel G. S. Matthijs Jansen Stefan Mathias |
| author_sort | Marcel Reutzel |
| collection | DOAJ |
| description | Excitons – two-particle correlated electron-hole pairs – are the dominant low-energy optical excitation in the broad class of semiconductor materials, which range from classical silicon to perovskites, and from two-dimensional to organic materials. The study of excitons has been brought on a new level of detail by the application of photoemission momentum microscopy – a technique that has dramatically extended the capabilities of time- and angle resolved photoemission spectroscopy. Here, we review how the photoelectron detection scheme enables direct access to the energy landscape of bright and dark excitons, and, more generally, to the momentum-coordinate of the exciton wavefunction. Focusing on two-dimensional materials and organic semiconductors, we first discuss the typical photoemission fingerprint of excitons in momentum microscopy and highlight that it is possible to obtain information not only on the electron- but also hole-component. Second, we focus on the recent application of photoemission orbital tomography to such excitons, and discuss how this provides a unique access to the real-space properties of the exciton wavefunction. We detail how studies performed on two-dimensional transition metal dichalcogenides and organic semiconductors lead to very similar conclusions, and, in this manner, highlight the strength of momentum microscopy for the study of optical excitations in semiconductors. |
| format | Article |
| id | doaj-art-7c3b5b23f08148e59b9396ec7951a74d |
| institution | OA Journals |
| issn | 2374-6149 |
| language | English |
| publishDate | 2024-12-01 |
| publisher | Taylor & Francis Group |
| record_format | Article |
| series | Advances in Physics: X |
| spelling | doaj-art-7c3b5b23f08148e59b9396ec7951a74d2025-08-20T02:31:08ZengTaylor & Francis GroupAdvances in Physics: X2374-61492024-12-019110.1080/23746149.2024.2378722Probing excitons with time-resolved momentum microscopyMarcel Reutzel0G. S. Matthijs Jansen1Stefan Mathias2I. Physikalisches Institut, Georg-August-Universität Göttingen, Göttingen, GermanyI. Physikalisches Institut, Georg-August-Universität Göttingen, Göttingen, GermanyI. Physikalisches Institut, Georg-August-Universität Göttingen, Göttingen, GermanyExcitons – two-particle correlated electron-hole pairs – are the dominant low-energy optical excitation in the broad class of semiconductor materials, which range from classical silicon to perovskites, and from two-dimensional to organic materials. The study of excitons has been brought on a new level of detail by the application of photoemission momentum microscopy – a technique that has dramatically extended the capabilities of time- and angle resolved photoemission spectroscopy. Here, we review how the photoelectron detection scheme enables direct access to the energy landscape of bright and dark excitons, and, more generally, to the momentum-coordinate of the exciton wavefunction. Focusing on two-dimensional materials and organic semiconductors, we first discuss the typical photoemission fingerprint of excitons in momentum microscopy and highlight that it is possible to obtain information not only on the electron- but also hole-component. Second, we focus on the recent application of photoemission orbital tomography to such excitons, and discuss how this provides a unique access to the real-space properties of the exciton wavefunction. We detail how studies performed on two-dimensional transition metal dichalcogenides and organic semiconductors lead to very similar conclusions, and, in this manner, highlight the strength of momentum microscopy for the study of optical excitations in semiconductors.https://www.tandfonline.com/doi/10.1080/23746149.2024.2378722Momentum microscopytime–and angle–resolved photoemission spectroscopyexcitons2D materialsorganic semiconductor |
| spellingShingle | Marcel Reutzel G. S. Matthijs Jansen Stefan Mathias Probing excitons with time-resolved momentum microscopy Advances in Physics: X Momentum microscopy time–and angle–resolved photoemission spectroscopy excitons 2D materials organic semiconductor |
| title | Probing excitons with time-resolved momentum microscopy |
| title_full | Probing excitons with time-resolved momentum microscopy |
| title_fullStr | Probing excitons with time-resolved momentum microscopy |
| title_full_unstemmed | Probing excitons with time-resolved momentum microscopy |
| title_short | Probing excitons with time-resolved momentum microscopy |
| title_sort | probing excitons with time resolved momentum microscopy |
| topic | Momentum microscopy time–and angle–resolved photoemission spectroscopy excitons 2D materials organic semiconductor |
| url | https://www.tandfonline.com/doi/10.1080/23746149.2024.2378722 |
| work_keys_str_mv | AT marcelreutzel probingexcitonswithtimeresolvedmomentummicroscopy AT gsmatthijsjansen probingexcitonswithtimeresolvedmomentummicroscopy AT stefanmathias probingexcitonswithtimeresolvedmomentummicroscopy |