Probing excitons with time-resolved momentum microscopy

Excitons – two-particle correlated electron-hole pairs – are the dominant low-energy optical excitation in the broad class of semiconductor materials, which range from classical silicon to perovskites, and from two-dimensional to organic materials. The study of excitons has been brought on a new lev...

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Main Authors: Marcel Reutzel, G. S. Matthijs Jansen, Stefan Mathias
Format: Article
Language:English
Published: Taylor & Francis Group 2024-12-01
Series:Advances in Physics: X
Subjects:
Online Access:https://www.tandfonline.com/doi/10.1080/23746149.2024.2378722
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_version_ 1850136500723777536
author Marcel Reutzel
G. S. Matthijs Jansen
Stefan Mathias
author_facet Marcel Reutzel
G. S. Matthijs Jansen
Stefan Mathias
author_sort Marcel Reutzel
collection DOAJ
description Excitons – two-particle correlated electron-hole pairs – are the dominant low-energy optical excitation in the broad class of semiconductor materials, which range from classical silicon to perovskites, and from two-dimensional to organic materials. The study of excitons has been brought on a new level of detail by the application of photoemission momentum microscopy – a technique that has dramatically extended the capabilities of time- and angle resolved photoemission spectroscopy. Here, we review how the photoelectron detection scheme enables direct access to the energy landscape of bright and dark excitons, and, more generally, to the momentum-coordinate of the exciton wavefunction. Focusing on two-dimensional materials and organic semiconductors, we first discuss the typical photoemission fingerprint of excitons in momentum microscopy and highlight that it is possible to obtain information not only on the electron- but also hole-component. Second, we focus on the recent application of photoemission orbital tomography to such excitons, and discuss how this provides a unique access to the real-space properties of the exciton wavefunction. We detail how studies performed on two-dimensional transition metal dichalcogenides and organic semiconductors lead to very similar conclusions, and, in this manner, highlight the strength of momentum microscopy for the study of optical excitations in semiconductors.
format Article
id doaj-art-7c3b5b23f08148e59b9396ec7951a74d
institution OA Journals
issn 2374-6149
language English
publishDate 2024-12-01
publisher Taylor & Francis Group
record_format Article
series Advances in Physics: X
spelling doaj-art-7c3b5b23f08148e59b9396ec7951a74d2025-08-20T02:31:08ZengTaylor & Francis GroupAdvances in Physics: X2374-61492024-12-019110.1080/23746149.2024.2378722Probing excitons with time-resolved momentum microscopyMarcel Reutzel0G. S. Matthijs Jansen1Stefan Mathias2I. Physikalisches Institut, Georg-August-Universität Göttingen, Göttingen, GermanyI. Physikalisches Institut, Georg-August-Universität Göttingen, Göttingen, GermanyI. Physikalisches Institut, Georg-August-Universität Göttingen, Göttingen, GermanyExcitons – two-particle correlated electron-hole pairs – are the dominant low-energy optical excitation in the broad class of semiconductor materials, which range from classical silicon to perovskites, and from two-dimensional to organic materials. The study of excitons has been brought on a new level of detail by the application of photoemission momentum microscopy – a technique that has dramatically extended the capabilities of time- and angle resolved photoemission spectroscopy. Here, we review how the photoelectron detection scheme enables direct access to the energy landscape of bright and dark excitons, and, more generally, to the momentum-coordinate of the exciton wavefunction. Focusing on two-dimensional materials and organic semiconductors, we first discuss the typical photoemission fingerprint of excitons in momentum microscopy and highlight that it is possible to obtain information not only on the electron- but also hole-component. Second, we focus on the recent application of photoemission orbital tomography to such excitons, and discuss how this provides a unique access to the real-space properties of the exciton wavefunction. We detail how studies performed on two-dimensional transition metal dichalcogenides and organic semiconductors lead to very similar conclusions, and, in this manner, highlight the strength of momentum microscopy for the study of optical excitations in semiconductors.https://www.tandfonline.com/doi/10.1080/23746149.2024.2378722Momentum microscopytime–and angle–resolved photoemission spectroscopyexcitons2D materialsorganic semiconductor
spellingShingle Marcel Reutzel
G. S. Matthijs Jansen
Stefan Mathias
Probing excitons with time-resolved momentum microscopy
Advances in Physics: X
Momentum microscopy
time–and angle–resolved photoemission spectroscopy
excitons
2D materials
organic semiconductor
title Probing excitons with time-resolved momentum microscopy
title_full Probing excitons with time-resolved momentum microscopy
title_fullStr Probing excitons with time-resolved momentum microscopy
title_full_unstemmed Probing excitons with time-resolved momentum microscopy
title_short Probing excitons with time-resolved momentum microscopy
title_sort probing excitons with time resolved momentum microscopy
topic Momentum microscopy
time–and angle–resolved photoemission spectroscopy
excitons
2D materials
organic semiconductor
url https://www.tandfonline.com/doi/10.1080/23746149.2024.2378722
work_keys_str_mv AT marcelreutzel probingexcitonswithtimeresolvedmomentummicroscopy
AT gsmatthijsjansen probingexcitonswithtimeresolvedmomentummicroscopy
AT stefanmathias probingexcitonswithtimeresolvedmomentummicroscopy