Soft X-Ray Polarimeter: Potential Instrumentation and Observations
We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine t...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Czech Technical University in Prague
2014-12-01
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| Series: | Acta Polytechnica CTU Proceedings |
| Online Access: | https://ojs.cvut.cz/ojs/index.php/APP/article/view/2422 |
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