Soft X-Ray Polarimeter: Potential Instrumentation and Observations
We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine t...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Czech Technical University in Prague
2014-12-01
|
| Series: | Acta Polytechnica CTU Proceedings |
| Online Access: | https://ojs.cvut.cz/ojs/index.php/APP/article/view/2422 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine three Stokes parameters: I, Q, and U - all as a function of energy. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors >90% over the entire 0.2 to 0.8 keV band. This instrument could be used in a small suborbital mission or adapted for use in an orbiting satellite to complement measurements at high energies. We present progress on laboratory work to demonstrate the capabilities of key components. |
|---|---|
| ISSN: | 2336-5382 |