Snyers, C., Ertveldt, J., Efthymiadis, K., & Helsen, J. Hyperspectral In-Situ Monitoring for Deep Learning-Based Anomaly Classification in Metal Additive Manufacturing. IEEE.
Chicago Style (17th ed.) CitationSnyers, Charles, Julien Ertveldt, Kyriakos Efthymiadis, and Jan Helsen. Hyperspectral In-Situ Monitoring for Deep Learning-Based Anomaly Classification in Metal Additive Manufacturing. IEEE.
MLA (9th ed.) CitationSnyers, Charles, et al. Hyperspectral In-Situ Monitoring for Deep Learning-Based Anomaly Classification in Metal Additive Manufacturing. IEEE.
Warning: These citations may not always be 100% accurate.