Semitela, Â., Pereira, M., Completo, A., Lau, N., & Santos, J. P. Improving Industrial Quality Control: A Transfer Learning Approach to Surface Defect Detection. MDPI AG.
Chicago Style (17th ed.) CitationSemitela, Ângela, Miguel Pereira, António Completo, Nuno Lau, and José P. Santos. Improving Industrial Quality Control: A Transfer Learning Approach to Surface Defect Detection. MDPI AG.
MLA (9th ed.) CitationSemitela, Ângela, et al. Improving Industrial Quality Control: A Transfer Learning Approach to Surface Defect Detection. MDPI AG.
Warning: These citations may not always be 100% accurate.