Analysis and Modeling of Intrinsic Capacitance in Enhancement Mode GaN HEMT

This paper analyzes the intrinsic capacitance of enhancement-mode (e-mode) Gallium Nitridebased High Electron Mobility Transistor (GaN HEMTs). The intrinsic capacitance was measured using <inline-formula> <tex-math notation="LaTeX">$C_{i s s}$ </tex-math></inline-formu...

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Bibliographic Details
Main Authors: Taeyoung Cho, Jesun Park, Sungyeop Jung, Myounggon Kang
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/11078449/
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