Advanced atomic force microscopy techniques V
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2025-01-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.16.6 |
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| _version_ | 1832544825567608832 |
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| author | Philipp Rahe Ilko Bald Nadine Hauptmann Regina Hoffmann-Vogel Harry Mönig Michael Reichling |
| author_facet | Philipp Rahe Ilko Bald Nadine Hauptmann Regina Hoffmann-Vogel Harry Mönig Michael Reichling |
| author_sort | Philipp Rahe |
| collection | DOAJ |
| format | Article |
| id | doaj-art-7445bb6f460c4d348a1f65700e31e05b |
| institution | Kabale University |
| issn | 2190-4286 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj-art-7445bb6f460c4d348a1f65700e31e05b2025-02-03T09:10:12ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862025-01-01161545610.3762/bjnano.16.62190-4286-16-6Advanced atomic force microscopy techniques VPhilipp Rahe0Ilko Bald1Nadine Hauptmann2Regina Hoffmann-Vogel3Harry Mönig4Michael Reichling5Institut für Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany Institute of Chemistry, Hybrid Nanostructures, University of Potsdam, Karl-Liebknecht-Straße 24–25, 14476 Potsdam, Germany Institute for Molecules and Materials, Radboud University, 6525 AJ Nijmegen, The Netherlands Institute of Physics and Astronomy, University of Potsdam, Karl-Liebknecht-Str. 24–25, 14476 Potsdam, Germany Physikalisches Institut, Universität Münster, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany Institut für Physik, Universität Osnabrück, Barbarastraße 7, 49076 Osnabrück, Germany https://doi.org/10.3762/bjnano.16.6afmatomic force microscopyconductivitydrift correctionforce spectroscopync-afmnon-contact atomic force microscopyresistivitytip–surface interaction |
| spellingShingle | Philipp Rahe Ilko Bald Nadine Hauptmann Regina Hoffmann-Vogel Harry Mönig Michael Reichling Advanced atomic force microscopy techniques V Beilstein Journal of Nanotechnology afm atomic force microscopy conductivity drift correction force spectroscopy nc-afm non-contact atomic force microscopy resistivity tip–surface interaction |
| title | Advanced atomic force microscopy techniques V |
| title_full | Advanced atomic force microscopy techniques V |
| title_fullStr | Advanced atomic force microscopy techniques V |
| title_full_unstemmed | Advanced atomic force microscopy techniques V |
| title_short | Advanced atomic force microscopy techniques V |
| title_sort | advanced atomic force microscopy techniques v |
| topic | afm atomic force microscopy conductivity drift correction force spectroscopy nc-afm non-contact atomic force microscopy resistivity tip–surface interaction |
| url | https://doi.org/10.3762/bjnano.16.6 |
| work_keys_str_mv | AT philipprahe advancedatomicforcemicroscopytechniquesv AT ilkobald advancedatomicforcemicroscopytechniquesv AT nadinehauptmann advancedatomicforcemicroscopytechniquesv AT reginahoffmannvogel advancedatomicforcemicroscopytechniquesv AT harrymonig advancedatomicforcemicroscopytechniquesv AT michaelreichling advancedatomicforcemicroscopytechniquesv |