APA (7th ed.) Citation

Hwang, J., Ha, S., & Kim, D. Wafer Defect Classification Algorithm With Label Embedding Using Contrastive Learning. IEEE.

Chicago Style (17th ed.) Citation

Hwang, Jeongjoon, Somi Ha, and Dohyun Kim. Wafer Defect Classification Algorithm With Label Embedding Using Contrastive Learning. IEEE.

MLA (9th ed.) Citation

Hwang, Jeongjoon, et al. Wafer Defect Classification Algorithm With Label Embedding Using Contrastive Learning. IEEE.