Pseudoexhaustive memory testing based on March A type march tests
The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necess...
Saved in:
Main Authors: | V. N. Yarmolik, I. Mrozek, S. V. Yarmolik |
---|---|
Format: | Article |
Language: | Russian |
Published: |
National Academy of Sciences of Belarus, the United Institute of Informatics Problems
2020-06-01
|
Series: | Informatika |
Subjects: | |
Online Access: | https://inf.grid.by/jour/article/view/1050 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Analysis and Synthesis March Memory Tests
by: V. N. Yarmolik, et al.
Published: (2021-07-01) -
PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1
by: V. N. Yarmolik, et al.
Published: (2018-03-01) -
Construction and application of march tests for pattern sensitive memory faults detection
by: V. N. Yarmolik, et al.
Published: (2021-03-01) -
Transparent memory tests with even repeating addresses for storage devices
by: V. N. Yarmolik, et al.
Published: (2021-09-01) -
Deconstructing the Testing Mode Effect: Analyzing the Difference Between Writing and No Writing on the Test
by: Daniel M. Settlage, et al.
Published: (2024-06-01)