Pseudoexhaustive memory testing based on March A type march tests
The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necess...
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| Format: | Article |
| Language: | Russian |
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National Academy of Sciences of Belarus, the United Institute of Informatics Problems
2020-06-01
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| Series: | Informatika |
| Subjects: | |
| Online Access: | https://inf.grid.by/jour/article/view/1050 |
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| _version_ | 1832543158328623104 |
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| author | V. N. Yarmolik I. Mrozek S. V. Yarmolik |
| author_facet | V. N. Yarmolik I. Mrozek S. V. Yarmolik |
| author_sort | V. N. Yarmolik |
| collection | DOAJ |
| description | The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necessary condition that test procedures must satisfy to deal complex faults, is substantiated. This condition is in the formation of a pseudo-exhaustive test for a given number of arbitrary memory cells. We study the effectiveness of single and double application of tests like MATS ++, March C– and March A, and also give its analytical estimates for a different number of k ≤ 10 memory cells participating in a malfunction. The applicability of the mathematical model of the combinatorial problem of the coupon collector for describing multiple memory testing is substantiated. The values of the average, minimum, and maximum multiplicity of multiple tests are presented to provide an exhaustive set of binary combinations for a given number of arbitrary memory cells. The validity of analytical estimates is experimentally shown and the high efficiency of the formation of a pseudo-exhaustive coverage by tests of the March A type is confirmed. |
| format | Article |
| id | doaj-art-70eb0b154ac04223abb7284686b68c6a |
| institution | Kabale University |
| issn | 1816-0301 |
| language | Russian |
| publishDate | 2020-06-01 |
| publisher | National Academy of Sciences of Belarus, the United Institute of Informatics Problems |
| record_format | Article |
| series | Informatika |
| spelling | doaj-art-70eb0b154ac04223abb7284686b68c6a2025-02-03T11:51:49ZrusNational Academy of Sciences of Belarus, the United Institute of Informatics ProblemsInformatika1816-03012020-06-01172547010.37661/1816-0301-2020-17-2-54-70919Pseudoexhaustive memory testing based on March A type march testsV. N. Yarmolik0I. Mrozek1S. V. Yarmolik2Belarusian State University of Informatics and RadioelectronicsBialystok University of TechnologyBelarusian State University of Informatics and RadioelectronicsThe relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necessary condition that test procedures must satisfy to deal complex faults, is substantiated. This condition is in the formation of a pseudo-exhaustive test for a given number of arbitrary memory cells. We study the effectiveness of single and double application of tests like MATS ++, March C– and March A, and also give its analytical estimates for a different number of k ≤ 10 memory cells participating in a malfunction. The applicability of the mathematical model of the combinatorial problem of the coupon collector for describing multiple memory testing is substantiated. The values of the average, minimum, and maximum multiplicity of multiple tests are presented to provide an exhaustive set of binary combinations for a given number of arbitrary memory cells. The validity of analytical estimates is experimentally shown and the high efficiency of the formation of a pseudo-exhaustive coverage by tests of the March A type is confirmed.https://inf.grid.by/jour/article/view/1050testing of computing systemsembedded testingmulti-run testingmarch memory testspseudo-exhaustive tests |
| spellingShingle | V. N. Yarmolik I. Mrozek S. V. Yarmolik Pseudoexhaustive memory testing based on March A type march tests Informatika testing of computing systems embedded testing multi-run testing march memory tests pseudo-exhaustive tests |
| title | Pseudoexhaustive memory testing based on March A type march tests |
| title_full | Pseudoexhaustive memory testing based on March A type march tests |
| title_fullStr | Pseudoexhaustive memory testing based on March A type march tests |
| title_full_unstemmed | Pseudoexhaustive memory testing based on March A type march tests |
| title_short | Pseudoexhaustive memory testing based on March A type march tests |
| title_sort | pseudoexhaustive memory testing based on march a type march tests |
| topic | testing of computing systems embedded testing multi-run testing march memory tests pseudo-exhaustive tests |
| url | https://inf.grid.by/jour/article/view/1050 |
| work_keys_str_mv | AT vnyarmolik pseudoexhaustivememorytestingbasedonmarchatypemarchtests AT imrozek pseudoexhaustivememorytestingbasedonmarchatypemarchtests AT svyarmolik pseudoexhaustivememorytestingbasedonmarchatypemarchtests |