Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based Resistors
The size effect, namely the change of sheet resistance, Rs as a function of resistor length, has been investigated in layers whose conductive phase evolves from Pb-rich (Ru-deficient pyrochlores) to Pb2Ru2O6.5 and finally to RuO2 by increasing the firing temperature. It is found that Bi diffusion fr...
Saved in:
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1991-01-01
|
| Series: | Active and Passive Electronic Components |
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1155/1991/94210 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1832562953561309184 |
|---|---|
| author | M. Prudenziati F. Sirotti M. Sacchi B. Morten A. Tombesi T. Akomolafe |
| author_facet | M. Prudenziati F. Sirotti M. Sacchi B. Morten A. Tombesi T. Akomolafe |
| author_sort | M. Prudenziati |
| collection | DOAJ |
| description | The size effect, namely the change of sheet resistance, Rs as a function of resistor length, has
been investigated in layers whose conductive phase evolves from Pb-rich (Ru-deficient pyrochlores) to
Pb2Ru2O6.5 and finally to RuO2 by increasing the firing temperature. It is found that Bi diffusion from
the terminations is responsible for lower sheet resistance values in shorter resistors whatever the conductive
phase is. On the contrary, Ag diffusion is responsible for lower sheet resistance values in shorter
resistors only in the case of ruthenate conductive grains while the reverse is observed in RuO2-based
layers. Size effect can be suppressed with Pt/Au-based terminations provided that no Bi is contained
and with Au-metallorganic-based contact provided that the peak firing temperature is not too high. |
| format | Article |
| id | doaj-art-7019b0769d3c46fd8277e795386dba12 |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 1991-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-7019b0769d3c46fd8277e795386dba122025-02-03T01:21:23ZengWileyActive and Passive Electronic Components0882-75161563-50311991-01-0114316317310.1155/1991/94210Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based ResistorsM. Prudenziati0F. Sirotti1M. Sacchi2B. Morten3A. Tombesi4T. Akomolafe5Department of Physics, University of Modena Via G. Campi 213/A, Modena 41100, ItalyDepartment of Physics, University of Modena Via G. Campi 213/A, Modena 41100, ItalyDepartment of Physics, University of Modena Via G. Campi 213/A, Modena 41100, ItalyDepartment of Physics, University of Modena Via G. Campi 213/A, Modena 41100, ItalyDepartment of Physics, University of Modena Via G. Campi 213/A, Modena 41100, ItalyPhys. Dept., University of Ilorin, NigeriaThe size effect, namely the change of sheet resistance, Rs as a function of resistor length, has been investigated in layers whose conductive phase evolves from Pb-rich (Ru-deficient pyrochlores) to Pb2Ru2O6.5 and finally to RuO2 by increasing the firing temperature. It is found that Bi diffusion from the terminations is responsible for lower sheet resistance values in shorter resistors whatever the conductive phase is. On the contrary, Ag diffusion is responsible for lower sheet resistance values in shorter resistors only in the case of ruthenate conductive grains while the reverse is observed in RuO2-based layers. Size effect can be suppressed with Pt/Au-based terminations provided that no Bi is contained and with Au-metallorganic-based contact provided that the peak firing temperature is not too high.http://dx.doi.org/10.1155/1991/94210thick film resistorssize effectselectronic components. |
| spellingShingle | M. Prudenziati F. Sirotti M. Sacchi B. Morten A. Tombesi T. Akomolafe Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based Resistors Active and Passive Electronic Components thick film resistors size effects electronic components. |
| title | Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based Resistors |
| title_full | Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based Resistors |
| title_fullStr | Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based Resistors |
| title_full_unstemmed | Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based Resistors |
| title_short | Size Effects in Ruthenium-Based Thick-Film Resistors: Rutile vs. Pyrochlore-Based Resistors |
| title_sort | size effects in ruthenium based thick film resistors rutile vs pyrochlore based resistors |
| topic | thick film resistors size effects electronic components. |
| url | http://dx.doi.org/10.1155/1991/94210 |
| work_keys_str_mv | AT mprudenziati sizeeffectsinrutheniumbasedthickfilmresistorsrutilevspyrochlorebasedresistors AT fsirotti sizeeffectsinrutheniumbasedthickfilmresistorsrutilevspyrochlorebasedresistors AT msacchi sizeeffectsinrutheniumbasedthickfilmresistorsrutilevspyrochlorebasedresistors AT bmorten sizeeffectsinrutheniumbasedthickfilmresistorsrutilevspyrochlorebasedresistors AT atombesi sizeeffectsinrutheniumbasedthickfilmresistorsrutilevspyrochlorebasedresistors AT takomolafe sizeeffectsinrutheniumbasedthickfilmresistorsrutilevspyrochlorebasedresistors |