Zou, X., Liu, Q., & Qiu, S. Electron Backscatter Diffraction Analysis of Low-Misorientation-Angle Boundary and High-Energy Boundary in the Hot-Rolled Plate of Grain-Orientated Silicon Steel. MDPI AG.
Chicago Style (17th ed.) CitationZou, Xiang, Qingyou Liu, and Shengtao Qiu. Electron Backscatter Diffraction Analysis of Low-Misorientation-Angle Boundary and High-Energy Boundary in the Hot-Rolled Plate of Grain-Orientated Silicon Steel. MDPI AG.
MLA (9th ed.) CitationZou, Xiang, et al. Electron Backscatter Diffraction Analysis of Low-Misorientation-Angle Boundary and High-Energy Boundary in the Hot-Rolled Plate of Grain-Orientated Silicon Steel. MDPI AG.
Warning: These citations may not always be 100% accurate.