RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution
The continuous progress in semiconductor technology, particularly in nanotechnology, has led to smaller memory cells and increased fault frequency due to their proximity. These faults reduce memory yield and raise production costs. Redundancy Analysis (RA) offers an effective solution by allocating...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10818484/ |
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