Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of...
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Wiley
2009-01-01
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Series: | Advances in Materials Science and Engineering |
Online Access: | http://dx.doi.org/10.1155/2009/928545 |
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author | A. Z. Simões C. S. Riccardi |
author_facet | A. Z. Simões C. S. Riccardi |
author_sort | A. Z. Simões |
collection | DOAJ |
description | SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 μC/cm2 and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film. |
format | Article |
id | doaj-art-6bcaa2a5914d4c7bbb184577dc04bcd5 |
institution | Kabale University |
issn | 1687-8434 1687-8442 |
language | English |
publishDate | 2009-01-01 |
publisher | Wiley |
record_format | Article |
series | Advances in Materials Science and Engineering |
spelling | doaj-art-6bcaa2a5914d4c7bbb184577dc04bcd52025-02-03T01:31:37ZengWileyAdvances in Materials Science and Engineering1687-84341687-84422009-01-01200910.1155/2009/928545928545Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical SolutionA. Z. Simões0C. S. Riccardi1Universidade Federal de Itajubá—Unifei, Campus Itabira, Rua São Paulo, 377, Bairro: Amazonas, 35900-37 Itabira, MG, BrazilLaboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, Bairro: Quitandinha, 14800-900 Araraquara, SP, BrazilSrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 μC/cm2 and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film.http://dx.doi.org/10.1155/2009/928545 |
spellingShingle | A. Z. Simões C. S. Riccardi Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution Advances in Materials Science and Engineering |
title | Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution |
title_full | Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution |
title_fullStr | Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution |
title_full_unstemmed | Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution |
title_short | Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution |
title_sort | dielectric spectroscopy analyses of srbi4ti4o15 films obtained from soft chemical solution |
url | http://dx.doi.org/10.1155/2009/928545 |
work_keys_str_mv | AT azsimoes dielectricspectroscopyanalysesofsrbi4ti4o15filmsobtainedfromsoftchemicalsolution AT csriccardi dielectricspectroscopyanalysesofsrbi4ti4o15filmsobtainedfromsoftchemicalsolution |