Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution

SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of...

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Main Authors: A. Z. Simões, C. S. Riccardi
Format: Article
Language:English
Published: Wiley 2009-01-01
Series:Advances in Materials Science and Engineering
Online Access:http://dx.doi.org/10.1155/2009/928545
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author A. Z. Simões
C. S. Riccardi
author_facet A. Z. Simões
C. S. Riccardi
author_sort A. Z. Simões
collection DOAJ
description SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 μC/cm2 and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film.
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spelling doaj-art-6bcaa2a5914d4c7bbb184577dc04bcd52025-02-03T01:31:37ZengWileyAdvances in Materials Science and Engineering1687-84341687-84422009-01-01200910.1155/2009/928545928545Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical SolutionA. Z. Simões0C. S. Riccardi1Universidade Federal de Itajubá—Unifei, Campus Itabira, Rua São Paulo, 377, Bairro: Amazonas, 35900-37 Itabira, MG, BrazilLaboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, Bairro: Quitandinha, 14800-900 Araraquara, SP, BrazilSrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 μC/cm2 and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film.http://dx.doi.org/10.1155/2009/928545
spellingShingle A. Z. Simões
C. S. Riccardi
Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
Advances in Materials Science and Engineering
title Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_full Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_fullStr Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_full_unstemmed Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_short Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution
title_sort dielectric spectroscopy analyses of srbi4ti4o15 films obtained from soft chemical solution
url http://dx.doi.org/10.1155/2009/928545
work_keys_str_mv AT azsimoes dielectricspectroscopyanalysesofsrbi4ti4o15filmsobtainedfromsoftchemicalsolution
AT csriccardi dielectricspectroscopyanalysesofsrbi4ti4o15filmsobtainedfromsoftchemicalsolution