Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography
Abstract Electron ptychography, recognized as an ideal technique for low-dose imaging, consistently achieves deep sub-angstrom resolution at electron doses of several thousand electrons per square angstrom (e−/Å2) or higher. Despite its proven efficacy, the application of electron ptychography at ev...
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| Main Authors: | , , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-01-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-025-56215-z |
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