Test method for static parameter of unipolar ADC
The static parameters of analog to digital converter (ADC) include differential nonlinearity (DNL) and integral nonlinearity (INL). The main method to measure static parameters is the code density histogram method.The traditional code density histogram method has high requirements on the calculation...
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National Computer System Engineering Research Institute of China
2024-02-01
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| Series: | Dianzi Jishu Yingyong |
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| Online Access: | http://www.chinaaet.com/article/3000163470 |
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| author | Zhu Qing Wei Kai Tao Qingping |
| author_facet | Zhu Qing Wei Kai Tao Qingping |
| author_sort | Zhu Qing |
| collection | DOAJ |
| description | The static parameters of analog to digital converter (ADC) include differential nonlinearity (DNL) and integral nonlinearity (INL). The main method to measure static parameters is the code density histogram method.The traditional code density histogram method has high requirements on the calculation accuracy of input sinusoidal amplitude. This paper proposes a normalized processing platform scheme based on code density histogram. According to the test requirements, the test excitation amplitude that meets the requirements is selected to verify the effectiveness of the normalized scheme.The experimental results show that normalization reduces the influence of sinusoidal amplitude change on the code density histogram method and improves the stability of the code density histogram method. |
| format | Article |
| id | doaj-art-69bfe00a3a4e4116a1378daa89af6228 |
| institution | OA Journals |
| issn | 0258-7998 |
| language | zho |
| publishDate | 2024-02-01 |
| publisher | National Computer System Engineering Research Institute of China |
| record_format | Article |
| series | Dianzi Jishu Yingyong |
| spelling | doaj-art-69bfe00a3a4e4116a1378daa89af62282025-08-20T02:24:14ZzhoNational Computer System Engineering Research Institute of ChinaDianzi Jishu Yingyong0258-79982024-02-01502606410.16157/j.issn.0258-7998.2344743000163470Test method for static parameter of unipolar ADCZhu Qing0Wei Kai1Tao Qingping2China Electronics Technology Group Corporation No.58 Research Institute， Wuxi 214035， ChinaChina Electronics Technology Group Corporation No.58 Research Institute， Wuxi 214035， ChinaChina Electronics Technology Group Corporation No.58 Research Institute， Wuxi 214035， ChinaThe static parameters of analog to digital converter (ADC) include differential nonlinearity (DNL) and integral nonlinearity (INL). The main method to measure static parameters is the code density histogram method.The traditional code density histogram method has high requirements on the calculation accuracy of input sinusoidal amplitude. This paper proposes a normalized processing platform scheme based on code density histogram. According to the test requirements, the test excitation amplitude that meets the requirements is selected to verify the effectiveness of the normalized scheme.The experimental results show that normalization reduces the influence of sinusoidal amplitude change on the code density histogram method and improves the stability of the code density histogram method.http://www.chinaaet.com/article/3000163470analog to digital converterdifferential nonlinearityintegral nonlinearitycode density histogramnormalized |
| spellingShingle | Zhu Qing Wei Kai Tao Qingping Test method for static parameter of unipolar ADC Dianzi Jishu Yingyong analog to digital converter differential nonlinearity integral nonlinearity code density histogram normalized |
| title | Test method for static parameter of unipolar ADC |
| title_full | Test method for static parameter of unipolar ADC |
| title_fullStr | Test method for static parameter of unipolar ADC |
| title_full_unstemmed | Test method for static parameter of unipolar ADC |
| title_short | Test method for static parameter of unipolar ADC |
| title_sort | test method for static parameter of unipolar adc |
| topic | analog to digital converter differential nonlinearity integral nonlinearity code density histogram normalized |
| url | http://www.chinaaet.com/article/3000163470 |
| work_keys_str_mv | AT zhuqing testmethodforstaticparameterofunipolaradc AT weikai testmethodforstaticparameterofunipolaradc AT taoqingping testmethodforstaticparameterofunipolaradc |