Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis
Relay protection devices must operate continuously throughout the year without anomalies. With the integration of advanced technology and process chips in secondary equipment, new risks need to be addressed to ensure the reliability of these relay protection devices. One such risk is the impact of α...
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| Format: | Article |
| Language: | English |
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MDPI AG
2025-01-01
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| Series: | Micromachines |
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| Online Access: | https://www.mdpi.com/2072-666X/16/1/69 |
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| author | Hualiang Zhou Hao Yu Zhiyang Zou Zhantao Su Zheng Xu Weitao Yang Chaohui He |
| author_facet | Hualiang Zhou Hao Yu Zhiyang Zou Zhantao Su Zheng Xu Weitao Yang Chaohui He |
| author_sort | Hualiang Zhou |
| collection | DOAJ |
| description | Relay protection devices must operate continuously throughout the year without anomalies. With the integration of advanced technology and process chips in secondary equipment, new risks need to be addressed to ensure the reliability of these relay protection devices. One such risk is the impact of α-particles inducing single event effects (SEEs) on the secondary equipment. To date, there has been limited assessment of the effects of α-particles on relay protection devices from a system perspective. This study evaluates the impact of SEE on relay protection devices through a Monte Carlo simulation, which is verified by α-particle radiation, fault injection, and fault tree analysis. It discusses the influence of SEEs with and without hardening measures in place. Additionally, this study examines the soft error probability when the target processor runs both general workloads and specific application workloads. The current research proposes a low-cost and effective reliability assessment method for secondary equipment considering single event effects. The findings provide new insights for the enhancement of future electric power grid systems. |
| format | Article |
| id | doaj-art-66df52a78ec2497bae2362845dff55b6 |
| institution | Kabale University |
| issn | 2072-666X |
| language | English |
| publishDate | 2025-01-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Micromachines |
| spelling | doaj-art-66df52a78ec2497bae2362845dff55b62025-01-24T13:42:01ZengMDPI AGMicromachines2072-666X2025-01-011616910.3390/mi16010069Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree AnalysisHualiang Zhou0Hao Yu1Zhiyang Zou2Zhantao Su3Zheng Xu4Weitao Yang5Chaohui He6State Grid Electric Power Research Institute, NARI Group Corporation, Nanjing 211106, ChinaSchool of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an 710071, ChinaState Grid Electric Power Research Institute, NARI Group Corporation, Nanjing 211106, ChinaState Grid Electric Power Research Institute, NARI Group Corporation, Nanjing 211106, ChinaState Grid Electric Power Research Institute, NARI Group Corporation, Nanjing 211106, ChinaSchool of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an 710071, ChinaSchool of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an 710071, ChinaRelay protection devices must operate continuously throughout the year without anomalies. With the integration of advanced technology and process chips in secondary equipment, new risks need to be addressed to ensure the reliability of these relay protection devices. One such risk is the impact of α-particles inducing single event effects (SEEs) on the secondary equipment. To date, there has been limited assessment of the effects of α-particles on relay protection devices from a system perspective. This study evaluates the impact of SEE on relay protection devices through a Monte Carlo simulation, which is verified by α-particle radiation, fault injection, and fault tree analysis. It discusses the influence of SEEs with and without hardening measures in place. Additionally, this study examines the soft error probability when the target processor runs both general workloads and specific application workloads. The current research proposes a low-cost and effective reliability assessment method for secondary equipment considering single event effects. The findings provide new insights for the enhancement of future electric power grid systems.https://www.mdpi.com/2072-666X/16/1/69relay protection deviceα-particlefault injectionsingle event upsetfault tree analysis |
| spellingShingle | Hualiang Zhou Hao Yu Zhiyang Zou Zhantao Su Zheng Xu Weitao Yang Chaohui He Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis Micromachines relay protection device α-particle fault injection single event upset fault tree analysis |
| title | Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis |
| title_full | Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis |
| title_fullStr | Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis |
| title_full_unstemmed | Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis |
| title_short | Relay Protection Device Reliability Assessment Through Radiation, Fault Injection and Fault Tree Analysis |
| title_sort | relay protection device reliability assessment through radiation fault injection and fault tree analysis |
| topic | relay protection device α-particle fault injection single event upset fault tree analysis |
| url | https://www.mdpi.com/2072-666X/16/1/69 |
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