The Application of Approximate Entropy Theory in Defects Detecting of IGBT Module
Defect is one of the key factors in reducing the reliability of the insulated gate bipolar transistor (IGBT) module, so developing the diagnostic method for defects inside the IGBT module is an important measure to avoid catastrophic failure and improves the reliability of power electronic converter...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2012-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/2012/309789 |
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| _version_ | 1832565650559598592 |
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| author | Shengqi Zhou Luowei Zhou Suncheng Liu Pengju Sun Quanming Luo Junke Wu |
| author_facet | Shengqi Zhou Luowei Zhou Suncheng Liu Pengju Sun Quanming Luo Junke Wu |
| author_sort | Shengqi Zhou |
| collection | DOAJ |
| description | Defect is one of the key factors in reducing the reliability of the insulated gate bipolar transistor (IGBT) module, so developing the diagnostic method for defects inside the IGBT module is an important measure to avoid catastrophic failure and improves the reliability of power electronic converters. For this reason, a novel diagnostic method based on the approximate entropy (ApEn) theory is presented in this paper, which can provide statistical diagnosis and allow the operator to replace defective IGBT modules timely. The proposed method is achieved by analyzing the cross ApEn of the gate voltages before and after the occurring of defects. Due to the local damage caused by aging, the intrinsic parasitic parameters of packaging materials or silicon chips inside the IGBT module such as parasitic inductances and capacitances may change over time, which will make remarkable variation in the gate voltage. That is to say the gate voltage is close coupled with the defects. Therefore, the variation is quantified and used as a precursor parameter to evaluate the health status of the IGBT module. Experimental results validate the correctness of the proposed method. |
| format | Article |
| id | doaj-art-669fe2188591406b947a9dbdc105210d |
| institution | Kabale University |
| issn | 0882-7516 1563-5031 |
| language | English |
| publishDate | 2012-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Active and Passive Electronic Components |
| spelling | doaj-art-669fe2188591406b947a9dbdc105210d2025-02-03T01:07:00ZengWileyActive and Passive Electronic Components0882-75161563-50312012-01-01201210.1155/2012/309789309789The Application of Approximate Entropy Theory in Defects Detecting of IGBT ModuleShengqi Zhou0Luowei Zhou1Suncheng Liu2Pengju Sun3Quanming Luo4Junke Wu5State Key Laboratory of Power Transmission Equipment & System Security and New Technology, University of Chongqing, Chongqing 400044, ChinaState Key Laboratory of Power Transmission Equipment & System Security and New Technology, University of Chongqing, Chongqing 400044, ChinaState Key Laboratory of Power Transmission Equipment & System Security and New Technology, University of Chongqing, Chongqing 400044, ChinaState Key Laboratory of Power Transmission Equipment & System Security and New Technology, University of Chongqing, Chongqing 400044, ChinaState Key Laboratory of Power Transmission Equipment & System Security and New Technology, University of Chongqing, Chongqing 400044, ChinaState Key Laboratory of Power Transmission Equipment & System Security and New Technology, University of Chongqing, Chongqing 400044, ChinaDefect is one of the key factors in reducing the reliability of the insulated gate bipolar transistor (IGBT) module, so developing the diagnostic method for defects inside the IGBT module is an important measure to avoid catastrophic failure and improves the reliability of power electronic converters. For this reason, a novel diagnostic method based on the approximate entropy (ApEn) theory is presented in this paper, which can provide statistical diagnosis and allow the operator to replace defective IGBT modules timely. The proposed method is achieved by analyzing the cross ApEn of the gate voltages before and after the occurring of defects. Due to the local damage caused by aging, the intrinsic parasitic parameters of packaging materials or silicon chips inside the IGBT module such as parasitic inductances and capacitances may change over time, which will make remarkable variation in the gate voltage. That is to say the gate voltage is close coupled with the defects. Therefore, the variation is quantified and used as a precursor parameter to evaluate the health status of the IGBT module. Experimental results validate the correctness of the proposed method.http://dx.doi.org/10.1155/2012/309789 |
| spellingShingle | Shengqi Zhou Luowei Zhou Suncheng Liu Pengju Sun Quanming Luo Junke Wu The Application of Approximate Entropy Theory in Defects Detecting of IGBT Module Active and Passive Electronic Components |
| title | The Application of Approximate Entropy Theory in Defects Detecting of IGBT Module |
| title_full | The Application of Approximate Entropy Theory in Defects Detecting of IGBT Module |
| title_fullStr | The Application of Approximate Entropy Theory in Defects Detecting of IGBT Module |
| title_full_unstemmed | The Application of Approximate Entropy Theory in Defects Detecting of IGBT Module |
| title_short | The Application of Approximate Entropy Theory in Defects Detecting of IGBT Module |
| title_sort | application of approximate entropy theory in defects detecting of igbt module |
| url | http://dx.doi.org/10.1155/2012/309789 |
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