PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1
Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-...
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| Format: | Article |
| Language: | Russian |
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National Academy of Sciences of Belarus, the United Institute of Informatics Problems
2018-03-01
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| Series: | Informatika |
| Subjects: | |
| Online Access: | https://inf.grid.by/jour/article/view/321 |
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| _version_ | 1832543219595870208 |
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| author | V. N. Yarmolik I. Mrozek B. A. Levantsevich |
| author_facet | V. N. Yarmolik I. Mrozek B. A. Levantsevich |
| author_sort | V. N. Yarmolik |
| collection | DOAJ |
| description | Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-exhaustive test based on multiple memory tests with a variable background is reduced to the combinatorial task of the coupon collector. Estimates of the mean, minimum, and maximum multiplicity of a multiple test are given to provide an exhaustive set of combinations for a given number of cells of a memory device. The validity of analytical estimates is shown experimentally and the possibility of pseudo-exhaustive memory testing is confirmed. |
| format | Article |
| id | doaj-art-66008cff48e446ac8b9e0e0eefb60b43 |
| institution | Kabale University |
| issn | 1816-0301 |
| language | Russian |
| publishDate | 2018-03-01 |
| publisher | National Academy of Sciences of Belarus, the United Institute of Informatics Problems |
| record_format | Article |
| series | Informatika |
| spelling | doaj-art-66008cff48e446ac8b9e0e0eefb60b432025-02-03T11:51:44ZrusNational Academy of Sciences of Belarus, the United Institute of Informatics ProblemsInformatika1816-03012018-03-01151110121303PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1V. N. Yarmolik0I. Mrozek1B. A. Levantsevich2Belarusian State University of Computer Science and Electronic Engineering, MinskPolitechnika Białostocka, BiałystokBelarusian State University of Computer Science and Electronic Engineering, MinskMethods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-exhaustive test based on multiple memory tests with a variable background is reduced to the combinatorial task of the coupon collector. Estimates of the mean, minimum, and maximum multiplicity of a multiple test are given to provide an exhaustive set of combinations for a given number of cells of a memory device. The validity of analytical estimates is shown experimentally and the possibility of pseudo-exhaustive memory testing is confirmed.https://inf.grid.by/jour/article/view/321march testspseudo-exhaustive testscoupon collector problem |
| spellingShingle | V. N. Yarmolik I. Mrozek B. A. Levantsevich PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1 Informatika march tests pseudo-exhaustive tests coupon collector problem |
| title | PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1 |
| title_full | PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1 |
| title_fullStr | PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1 |
| title_full_unstemmed | PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1 |
| title_short | PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1 |
| title_sort | pseudo exhaustive memory devices testing based on multiple march tests 1 |
| topic | march tests pseudo-exhaustive tests coupon collector problem |
| url | https://inf.grid.by/jour/article/view/321 |
| work_keys_str_mv | AT vnyarmolik pseudoexhaustivememorydevicestestingbasedonmultiplemarchtests1 AT imrozek pseudoexhaustivememorydevicestestingbasedonmultiplemarchtests1 AT balevantsevich pseudoexhaustivememorydevicestestingbasedonmultiplemarchtests1 |