Voltage Degradation Model of Thin Film Capacitors
A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a function of working voltage. On the base of this model, the short term breakdown voltage and its dist...
Saved in:
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1985-01-01
|
| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1985/26014 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|