A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling
Counterfeit electronic components are known to enter supply chains through recycling, with these already-aged components creating serious reliability risks, particularly for critical infrastructure systems. A number of recycled integrated circuit (IC) risk mitigation approaches have been proposed, b...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Open Journal of Circuits and Systems |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10736936/ |
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| Summary: | Counterfeit electronic components are known to enter supply chains through recycling, with these already-aged components creating serious reliability risks, particularly for critical infrastructure systems. A number of recycled integrated circuit (IC) risk mitigation approaches have been proposed, but these generally lack pragmatic feasibility. This work proposes a novel real-world deployable on-chip sensor that: 1) is tamper-resistant by exploiting persistent changes caused by hot carrier injection (HCI); 2) generates a DC signal measurable by common low-cost test equipment; and 3) reuses an existing I/O interface, including existing pins; while 4) requiring a very small footprint. Combining this sensor with a random sample-based testing strategy allows for low-cost and time efficient detection of fraudulently recycled batches of ICs. Through simulation-based validation using process-accurate models of a 65 nm technology we show that employing a random sample size as small as 130 is sufficient for identifying such batches with a statistical significance level of 0.01. |
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| ISSN: | 2644-1225 |