Zubairova, U. S., & Doroshkov, A. V. Wheat leaf epidermal pattern as a model for studying the influence of stress conditions on morphogenesis. Siberian Branch of the Russian Academy of Sciences, Federal Research Center Institute of Cytology and Genetics, The Vavilov Society of Geneticists and Breeders.
Chicago Style (17th ed.) CitationZubairova, U. S., and A. V. Doroshkov. Wheat Leaf Epidermal Pattern as a Model for Studying the Influence of Stress Conditions on Morphogenesis. Siberian Branch of the Russian Academy of Sciences, Federal Research Center Institute of Cytology and Genetics, The Vavilov Society of Geneticists and Breeders.
MLA (9th ed.) CitationZubairova, U. S., and A. V. Doroshkov. Wheat Leaf Epidermal Pattern as a Model for Studying the Influence of Stress Conditions on Morphogenesis. Siberian Branch of the Russian Academy of Sciences, Federal Research Center Institute of Cytology and Genetics, The Vavilov Society of Geneticists and Breeders.