Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates

Structural, optical, and morphological properties of Ag thin films before and after etching were investigated by using X-ray diffraction, UV-Vis spectrophotometer, and field emission scanning electron microscopy (FESEM). The HNO3 roughened Ag thin films exhibit excellent enhancement features and bet...

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Main Authors: Desapogu Rajesh, M. Mahendar, C. S. Sunandana
Format: Article
Language:English
Published: Wiley 2013-01-01
Series:Journal of Chemistry
Online Access:http://dx.doi.org/10.1155/2013/285431
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author Desapogu Rajesh
M. Mahendar
C. S. Sunandana
author_facet Desapogu Rajesh
M. Mahendar
C. S. Sunandana
author_sort Desapogu Rajesh
collection DOAJ
description Structural, optical, and morphological properties of Ag thin films before and after etching were investigated by using X-ray diffraction, UV-Vis spectrophotometer, and field emission scanning electron microscopy (FESEM). The HNO3 roughened Ag thin films exhibit excellent enhancement features and better stability than pure Ag thin films. Further, the Ag nanostructures are covered with Rhodamine 6G (Rh6G) and then tested with surface enhanced raman spectroscopy (SERS) for active substrates. Etched Ag films were found to exhibit a strong SERS effect and excellent thermal stability. Hence, the present method is found to be useful in the development of plasmon-based analytical devices, especially SERS-based biosensors.
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publishDate 2013-01-01
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series Journal of Chemistry
spelling doaj-art-5ec2cb39b12946efa49825a3a621671e2025-02-03T05:48:18ZengWileyJournal of Chemistry2090-90632090-90712013-01-01201310.1155/2013/285431285431Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active SubstratesDesapogu Rajesh0M. Mahendar1C. S. Sunandana2School of Physics, University of Hyderabad, Hyderabad 500046, IndiaSchool of Physics, University of Hyderabad, Hyderabad 500046, IndiaSchool of Physics, University of Hyderabad, Hyderabad 500046, IndiaStructural, optical, and morphological properties of Ag thin films before and after etching were investigated by using X-ray diffraction, UV-Vis spectrophotometer, and field emission scanning electron microscopy (FESEM). The HNO3 roughened Ag thin films exhibit excellent enhancement features and better stability than pure Ag thin films. Further, the Ag nanostructures are covered with Rhodamine 6G (Rh6G) and then tested with surface enhanced raman spectroscopy (SERS) for active substrates. Etched Ag films were found to exhibit a strong SERS effect and excellent thermal stability. Hence, the present method is found to be useful in the development of plasmon-based analytical devices, especially SERS-based biosensors.http://dx.doi.org/10.1155/2013/285431
spellingShingle Desapogu Rajesh
M. Mahendar
C. S. Sunandana
Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
Journal of Chemistry
title Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
title_full Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
title_fullStr Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
title_full_unstemmed Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
title_short Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
title_sort effect of etching on the optical morphological properties of ag thin films for sers active substrates
url http://dx.doi.org/10.1155/2013/285431
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