Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
Structural, optical, and morphological properties of Ag thin films before and after etching were investigated by using X-ray diffraction, UV-Vis spectrophotometer, and field emission scanning electron microscopy (FESEM). The HNO3 roughened Ag thin films exhibit excellent enhancement features and bet...
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Format: | Article |
Language: | English |
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Wiley
2013-01-01
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Series: | Journal of Chemistry |
Online Access: | http://dx.doi.org/10.1155/2013/285431 |
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author | Desapogu Rajesh M. Mahendar C. S. Sunandana |
author_facet | Desapogu Rajesh M. Mahendar C. S. Sunandana |
author_sort | Desapogu Rajesh |
collection | DOAJ |
description | Structural, optical, and morphological properties of Ag thin films before and after etching were investigated by using X-ray diffraction, UV-Vis spectrophotometer, and field emission scanning electron microscopy (FESEM). The HNO3 roughened Ag thin films exhibit excellent enhancement features and better stability than pure Ag thin films. Further, the Ag nanostructures are covered with Rhodamine 6G (Rh6G) and then tested with surface enhanced raman spectroscopy (SERS) for active substrates. Etched Ag films were found to exhibit a strong SERS effect and excellent thermal stability. Hence, the present method is found to be useful in the development of plasmon-based analytical devices, especially SERS-based biosensors. |
format | Article |
id | doaj-art-5ec2cb39b12946efa49825a3a621671e |
institution | Kabale University |
issn | 2090-9063 2090-9071 |
language | English |
publishDate | 2013-01-01 |
publisher | Wiley |
record_format | Article |
series | Journal of Chemistry |
spelling | doaj-art-5ec2cb39b12946efa49825a3a621671e2025-02-03T05:48:18ZengWileyJournal of Chemistry2090-90632090-90712013-01-01201310.1155/2013/285431285431Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active SubstratesDesapogu Rajesh0M. Mahendar1C. S. Sunandana2School of Physics, University of Hyderabad, Hyderabad 500046, IndiaSchool of Physics, University of Hyderabad, Hyderabad 500046, IndiaSchool of Physics, University of Hyderabad, Hyderabad 500046, IndiaStructural, optical, and morphological properties of Ag thin films before and after etching were investigated by using X-ray diffraction, UV-Vis spectrophotometer, and field emission scanning electron microscopy (FESEM). The HNO3 roughened Ag thin films exhibit excellent enhancement features and better stability than pure Ag thin films. Further, the Ag nanostructures are covered with Rhodamine 6G (Rh6G) and then tested with surface enhanced raman spectroscopy (SERS) for active substrates. Etched Ag films were found to exhibit a strong SERS effect and excellent thermal stability. Hence, the present method is found to be useful in the development of plasmon-based analytical devices, especially SERS-based biosensors.http://dx.doi.org/10.1155/2013/285431 |
spellingShingle | Desapogu Rajesh M. Mahendar C. S. Sunandana Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates Journal of Chemistry |
title | Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates |
title_full | Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates |
title_fullStr | Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates |
title_full_unstemmed | Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates |
title_short | Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates |
title_sort | effect of etching on the optical morphological properties of ag thin films for sers active substrates |
url | http://dx.doi.org/10.1155/2013/285431 |
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