SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications
The Ternary Content Addressable Memory (TCAM) is a crucial component of satellite communication systems. Space-oriented TCAMs face unique challenges, as they must operate within a very limited energy budget and are susceptible to high Soft Error Rates (SER) due to ionizing particle radiation. The Du...
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2025-01-01
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| Online Access: | https://ieeexplore.ieee.org/document/10838519/ |
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| author | Itay Merlin Benjamin Zambrano Marco Lanuzza Alexander Fish Avner Haran Leonid Yavits |
| author_facet | Itay Merlin Benjamin Zambrano Marco Lanuzza Alexander Fish Avner Haran Leonid Yavits |
| author_sort | Itay Merlin |
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| description | The Ternary Content Addressable Memory (TCAM) is a crucial component of satellite communication systems. Space-oriented TCAMs face unique challenges, as they must operate within a very limited energy budget and are susceptible to high Soft Error Rates (SER) due to ionizing particle radiation. The Dual Interlocked Storage Cell (DICE) based memory is capable of withstanding soft errors. However, its reliability diminishes in presence of multiple node upsets. Moreover, recent studies indicate that DICE resilience to even single-node upsets degrades in advanced technology nodes. This issue is further exacerbated by the scaling of the supply voltage to reduce power consumption. In this paper, we propose SpaceCAM, a DICE-based TCAM that overcomes the above limitations and enables aggressive voltage scaling while withstanding multiple node upsets in each memory row. SpaceCAM enables soft error tolerance by applying an approximate rather than an exact search. It tolerates up to 5 soft errors per 144-bit row, provided the minimum Hamming distance between stored data patterns (such as the Active Control List (ACL) rules) is 26. When designed using a 16nm FinFET commercial process, SpaceCAM <inline-formula> <tex-math notation="LaTeX">$144\times 512$ </tex-math></inline-formula>-bit memory core operates at a supply voltage of as low as 350mV, consuming 2mW while running at 500MHz. |
| format | Article |
| id | doaj-art-5dca7ac27ff14c75b7489919bd04e0f8 |
| institution | Kabale University |
| issn | 2169-3536 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IEEE |
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| spelling | doaj-art-5dca7ac27ff14c75b7489919bd04e0f82025-01-24T00:01:16ZengIEEEIEEE Access2169-35362025-01-0113120321204310.1109/ACCESS.2025.352874510838519SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication ApplicationsItay Merlin0Benjamin Zambrano1https://orcid.org/0000-0002-1301-3447Marco Lanuzza2https://orcid.org/0000-0002-6480-9218Alexander Fish3https://orcid.org/0000-0002-4994-1536Avner Haran4https://orcid.org/0000-0002-0623-7637Leonid Yavits5https://orcid.org/0000-0001-5248-3997EnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, IsraelDepartment of Computer Engineering, Modeling, Electronics and Systems, University of Calabria, Rende, ItalyDepartment of Computer Engineering, Modeling, Electronics and Systems, University of Calabria, Rende, ItalyEnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, IsraelSoreq NRC, Yavne, IsraelEnICS Laboratories, Faculty of Engineering, Bar-Ilan University, Ramat Gan, IsraelThe Ternary Content Addressable Memory (TCAM) is a crucial component of satellite communication systems. Space-oriented TCAMs face unique challenges, as they must operate within a very limited energy budget and are susceptible to high Soft Error Rates (SER) due to ionizing particle radiation. The Dual Interlocked Storage Cell (DICE) based memory is capable of withstanding soft errors. However, its reliability diminishes in presence of multiple node upsets. Moreover, recent studies indicate that DICE resilience to even single-node upsets degrades in advanced technology nodes. This issue is further exacerbated by the scaling of the supply voltage to reduce power consumption. In this paper, we propose SpaceCAM, a DICE-based TCAM that overcomes the above limitations and enables aggressive voltage scaling while withstanding multiple node upsets in each memory row. SpaceCAM enables soft error tolerance by applying an approximate rather than an exact search. It tolerates up to 5 soft errors per 144-bit row, provided the minimum Hamming distance between stored data patterns (such as the Active Control List (ACL) rules) is 26. When designed using a 16nm FinFET commercial process, SpaceCAM <inline-formula> <tex-math notation="LaTeX">$144\times 512$ </tex-math></inline-formula>-bit memory core operates at a supply voltage of as low as 350mV, consuming 2mW while running at 500MHz.https://ieeexplore.ieee.org/document/10838519/Radiation hardnessternary content addressable memoryapproximate searchvoltage scalinglow-power design |
| spellingShingle | Itay Merlin Benjamin Zambrano Marco Lanuzza Alexander Fish Avner Haran Leonid Yavits SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications IEEE Access Radiation hardness ternary content addressable memory approximate search voltage scaling low-power design |
| title | SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications |
| title_full | SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications |
| title_fullStr | SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications |
| title_full_unstemmed | SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications |
| title_short | SpaceCAM: A 16 nm FinFET Low-Power Soft-Error Tolerant TCAM Design for Space Communication Applications |
| title_sort | spacecam a 16 nm finfet low power soft error tolerant tcam design for space communication applications |
| topic | Radiation hardness ternary content addressable memory approximate search voltage scaling low-power design |
| url | https://ieeexplore.ieee.org/document/10838519/ |
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