The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior
The presence of microcracks may lead to loss in the module output power and safety hazard of the module. This paper investigated whether the existed microscopic microcracks in cells will facilitate the PID behavior. Cells with different degrees of microcracks were fabricated into small modules to un...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2018-01-01
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| Series: | International Journal of Photoenergy |
| Online Access: | http://dx.doi.org/10.1155/2018/4381579 |
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| _version_ | 1832550356067811328 |
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| author | Xianfang Gou Xiaoyan Li Shaoliang Wang Hao Zhuang Xixi Huang Likai Jiang |
| author_facet | Xianfang Gou Xiaoyan Li Shaoliang Wang Hao Zhuang Xixi Huang Likai Jiang |
| author_sort | Xianfang Gou |
| collection | DOAJ |
| description | The presence of microcracks may lead to loss in the module output power and safety hazard of the module. This paper investigated whether the existed microscopic microcracks in cells will facilitate the PID behavior. Cells with different degrees of microcracks were fabricated into small modules to undergo the simulated PID test. The I-V performance and EL images of the modules were characterized before and after the PID test. The obtained results demonstrate that with the increase in the microcracked area or length, the modules would show a more serious PID behavior. The mechanism of this microcrack length-related degradation under high negative bias was proposed. |
| format | Article |
| id | doaj-art-5d03eab8eed042abaa6c4656b9949fa1 |
| institution | Kabale University |
| issn | 1110-662X 1687-529X |
| language | English |
| publishDate | 2018-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | International Journal of Photoenergy |
| spelling | doaj-art-5d03eab8eed042abaa6c4656b9949fa12025-02-03T06:07:02ZengWileyInternational Journal of Photoenergy1110-662X1687-529X2018-01-01201810.1155/2018/43815794381579The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation BehaviorXianfang Gou0Xiaoyan Li1Shaoliang Wang2Hao Zhuang3Xixi Huang4Likai Jiang5Beijing University of Technology, Beijing 100124, ChinaBeijing University of Technology, Beijing 100124, ChinaBeijing Jiaotong University, Beijing 100044, ChinaCECEP Solar Energy Technology (Zhenjiang) Co., Ltd., Zhenjiang 212132, ChinaCECEP Solar Energy Technology (Zhenjiang) Co., Ltd., Zhenjiang 212132, ChinaCECEP Solar Energy Technology (Zhenjiang) Co., Ltd., Zhenjiang 212132, ChinaThe presence of microcracks may lead to loss in the module output power and safety hazard of the module. This paper investigated whether the existed microscopic microcracks in cells will facilitate the PID behavior. Cells with different degrees of microcracks were fabricated into small modules to undergo the simulated PID test. The I-V performance and EL images of the modules were characterized before and after the PID test. The obtained results demonstrate that with the increase in the microcracked area or length, the modules would show a more serious PID behavior. The mechanism of this microcrack length-related degradation under high negative bias was proposed.http://dx.doi.org/10.1155/2018/4381579 |
| spellingShingle | Xianfang Gou Xiaoyan Li Shaoliang Wang Hao Zhuang Xixi Huang Likai Jiang The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior International Journal of Photoenergy |
| title | The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior |
| title_full | The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior |
| title_fullStr | The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior |
| title_full_unstemmed | The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior |
| title_short | The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior |
| title_sort | effect of microcrack length in silicon cells on the potential induced degradation behavior |
| url | http://dx.doi.org/10.1155/2018/4381579 |
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