APA (7th ed.) Citation

Gou, X., Li, X., Wang, S., Zhuang, H., Huang, X., & Jiang, L. The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior. Wiley.

Chicago Style (17th ed.) Citation

Gou, Xianfang, Xiaoyan Li, Shaoliang Wang, Hao Zhuang, Xixi Huang, and Likai Jiang. The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior. Wiley.

MLA (9th ed.) Citation

Gou, Xianfang, et al. The Effect of Microcrack Length in Silicon Cells on the Potential Induced Degradation Behavior. Wiley.